FN-2
- Structure, texture and topography
- Surfaces and interfaces
- Characterisation methods at single nanoparticle level
- Solid state, electronic, vibrational structure
- Structural defect states and impurities
- sp2-sp3 bonding distributions
- Spectroscopic techniques (Raman, NEXAFS, etc.)
- Surface characterization (STM, AFM, NSOM, RAS, etc.)
- X-ray optics and detections