Invited Lectures FI
Christopher A. BOWER / Antonio J. TRINDADE, X-Celeprint Inc., USA
Ludwig EDMAN, Umea University, Sweden
Hiroshi FUJIOKA, University of Tokyo, Japan
Hirohiko FUKAGAWA, Japan Broadcasting Corporation, Japan
H.T.(Bert) HINTZEN, Delft University of Technology, Netherlands
Hideki HIRAYAMA / Tsung-Tse LIN, RIKEN, Japan
Motoaki IWAYA, Meijo University, Japan
Nicolas LAURAND, University of Strathclyde, UK
Pierre LEFEBVRE, L2C - CNRS - University of Montpellier, France
Hans LUGAUER, OSRAM Opto Semiconductors GmbH, Germany
Christian MAY, Fraunhofer FEP, Germany
Hideto MIYAKE, Mie University, Japan
Jongwook PARK, Kyung Hee University, South Korea
Barry RAND, Princeton University, USA
Stefano TOFFANIN, CNR-ISMN, Italy
Nicola TRIVELLIN, Light Cube, Padova, Italy
Xiao-Jun WANG, Georgia Southern University, USA
Ken-Tsung WONG, National Taiwan University, Taiwan
Takuma YASUDA, Kyushu University, Japan
Ludwig EDMAN, Umea University, Sweden
Hiroshi FUJIOKA, University of Tokyo, Japan
Hirohiko FUKAGAWA, Japan Broadcasting Corporation, Japan
H.T.(Bert) HINTZEN, Delft University of Technology, Netherlands
Hideki HIRAYAMA / Tsung-Tse LIN, RIKEN, Japan
Motoaki IWAYA, Meijo University, Japan
Nicolas LAURAND, University of Strathclyde, UK
Pierre LEFEBVRE, L2C - CNRS - University of Montpellier, France
Hans LUGAUER, OSRAM Opto Semiconductors GmbH, Germany
Christian MAY, Fraunhofer FEP, Germany
Hideto MIYAKE, Mie University, Japan
Jongwook PARK, Kyung Hee University, South Korea
Barry RAND, Princeton University, USA
Stefano TOFFANIN, CNR-ISMN, Italy
Nicola TRIVELLIN, Light Cube, Padova, Italy
Xiao-Jun WANG, Georgia Southern University, USA
Ken-Tsung WONG, National Taiwan University, Taiwan
Takuma YASUDA, Kyushu University, Japan







